Sunday,
June 13, 2004
18:00 Welcome Party (Banach Center)
Monday,
June 14, 2004
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10:00-10:15
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Opening Ceremony
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10:15-10:45
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Does the Rational-Subgroups Concept Provide an
Effective Guide for Process Sampling
Marion
R. Reynolds and Zachary G. Stoumbos
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10:45-11:15
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Effective Dynamic Process Control of Assembly
Processes
Tomomichi Suzuki, Yoshikazu Ojima, Taku Harada
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11:15-11:45
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Influence
of Turning Point Characteristics on a System for
Non-Parametric Surveillance
Eva Andersson
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11:45-12:15
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Coffee Break
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12:15-12:45
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Data
Mining and Statistical Control - Some Links
Rainer Göb
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12:45-13:15
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Misleading
Signals in Joint Schemes for µ and s
Manuel Cabral Morais and Antonio Pacheco
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13:15-13:45
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Optimal
Process Calibration under Nonsymmetric Loss
Function
Przemys³aw
Grzegorzewski and Edyta Mrówka
|
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13:45-15:00
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Lunch
|
|
15:00-15:30
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Optimal Curtailed Sequential Sampling Plan for a Low Fraction
Nonconforming
Olgierd Hryniewicz
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15:30-16:00
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Three-Class
Sampling Plans: A Review with
Applications
Frank A. Palcat
|
|
16:00-16:30
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How Some
ISO Standards Complicate Quality Improvement
Elart von Collani and Frank A. Palcat
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16:30-16:45
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Coffee Break
|
|
16:45-17:30
|
Frontiers
in Statistical Quality Control-Today and Tomorrow
Panel Discussion
|
Tuesday,
June 15, 2004
|
9:30-10:00
|
The Inertial Properties of
Quality Control Charts
William H. Woodall
and Mahmoud A. Mahmoud
|
|
10:00-10:30
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Generalization
of the Shewhart Control Chart by the Run Rules
Seiichi Yasui,
Yoshikazu Ojima, Tomomichi
Suzuki
|
|
10:30-11:00
|
Reconsideration of Control Charts
Ken
Nishin, Kazuyoshi
Kuzuya, Naru Ishii
|
|
11:00-11:30
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CUSUM
Control Schemes for Multivariate Time Series
Olha Bodnar and Wolfgang Schmid
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Coffee Break
|
|
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Excursion
|
|
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Lunch
|
|
15:00-15:30
|
Economic
Advantages of CUSUM Control Charts for Variables
Erwin Saniga, Thomas
McWilliams, Darwin Davis, James Lucas
|
|
15:30-16:00
|
The Art
of Evaluating Monitoring Schemes-How to Measure
the Performance of Control Charts?
Sven Knoth
|
|
16:00-16:30
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Frechet Control
Charts
Edyta Mrówka and Przemys³aw Grzegorzewski
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|
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Conference Dinner
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Wednesday,
June 16, 2004
|
10:00-10:30
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Occurrence
of Negative Estimates of the ANOVA Estimators
in the Variance Components Estimation by Nested Experiments
Yoshikazu Ojima,
Seiichi Yasui, Feng Ling,
Tomomichi Suzuki, Taku
Harada
|
|
10:30-11:00
|
Statistical
Methods Applied to Semiconductor Manufacturing Process
Takeshi Koyama
|
|
11:00-11:30
|
Monitoring
the Number of Children Injured in Traffic Accidents
F. Pokropp, W. Seidel, A. Begun, M. Heidenreich,
K. Sever
|
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11:30-12:00
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Coffee Break
|
|
12:00-12:30
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Specification Setting
for Drugs in the Pharmaceutical Industry
Jørgen Iwersen
and Henrik Melgaard
|
|
12:30-13:00
|
Combination
of Multivariate Statistical Process Control
and Classification Tool for Situation Assessment Applied
to a Sequencing Batch Reactor Wastewater Treatment
Magda L. Ruiz, Joan Colomer, Montserrat Rubio,
Joaquim Meléndez
|
|
13:00-13:30
|
An
overview of composite designs run as split-plots
Geoff Vining, Scott
Kowalski
|
|
13:30
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Closing
Ceremony
|
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